Electron Microscopy Techniques:

1. M. Kim, J.M. Zuo, G.S. Park, High-resolution strain measurement in shallow trench isolation structures using dynamic electron diffraction, Appl. Phys. Lett.84, 2181-2183 (2004) PDF
2. J.M. Zuo, I. Vartanyants, M. Gao, R. Zhang and L.A. Nagahara, Atomic Resolution Imaging of A Single Double-Wall Carbon Nanotube From Diffraction Intensities, Science, 300, 1419-1421 (2003) PDF
3. J.M. Zuo, "Quantitative Electron Incoherent Scattering and Application to Nanometer-Sized Charge Ordering in La(2/3)Ca(1/3)MnO(3)" J. of Electron Microscopy, 51: S67-S72 Suppl. S (2002)
4. Zuo, J. M., "Electron detection characteristics of a slow-scan CCD camera, imaging plates and film, and electron image restoration" Micros. Res. Tech., 49, 245-268 (2000) PDF
5. Zuo, J. M., Weierstall, U., Peng, L. M. and Spence, J. C., 2000, Surface structural sensitivity of convergent-beam RHEED: Si (001)2x1 models compared with dynamical simulations: Ultramicroscopy, 81, 235-244
6. J.M. Zuo, ¡°Quantitative convergent beam electron diffraction", Materials Transactions JIM 39, 938-946 (1998)