[2] Kim T, Kim S, Olson E, Zuo JM. In situ measurements and transmission electron microscopy of carbon nanotube field-effect transistors. Ultramicroscopy 2008:In print.

[3] Zuo JM, Kim T, Celik-Aktas A, Tao J. Quantitative Structural Analysis of Individual Nanotubes by Electron Diffraction. Zeitschrift fur Kristallographie 2007; 222:625.

[4] Zhou W, Huang Y, Liu B, Hwang KC, Zuo JM, Buehler MJ, Gao H. Self-folding of single- and multiwall carbon nanotubes. Applied Physics Letters 2007;90:073107.

[5] Smadici S, Abbamonte P, Bhattacharya A, Zhai XF, Jiang B, Rusydi A, Eckstein JN, Bader SD, Zuo JM. Electronic reconstruction at SrMnO3-LaMnO3 superlattice interfaces. Physical Review Letters 2007;99:196404.

[6] Sato K, Huang WJ, Bohra F, Sivaramakrishnan S, Tedjasaputra AP, Zuo JM. Size-dependent structural transition from multiply-twinned particles to epitaxial FCC nanocrystals and nanocrystal decay. Physical Review B 2007;76:144113.

[7] Park GS, Kwon JH, Kim M, Yoon HR, Jo W, Kim TK, Zuo JM, Khang Y. Crystalline and amorphous structures of Ge-Sb-Te nanoparticles. Journal of Applied Physics 2007;102:013524.

[8] Park GS, Bae SC, Granick S, Lee JH, Bae SD, Kim T, Zuo JM. Naturally formed epitaxial diamond crystals in rubies. Diamond and Related Materials 2007;16:397.

[9] Huang WJ, Jiang B, Sun RS, Zuo JM. Towards sub-A atomic resolution electron diffraction imaging of metallic nanoclusters: A simulation study of experimental parameters and reconstruction algorithms. Ultramicroscopy 2007;107:1159.

[10] Chen H, Zuo JM. Structure and phase separation of Ag-Cu alloy thin films. Acta Materialia 2007;55:1617.

[11] Celik-Aktas A, Stubbins JF, Zuo JM. Electron beam machining of nanometer-sized tips from multiwalled boron nitride nanotubes. Journal of Applied Physics 2007;102:024310.

[12] Camargo PHC, Xiong Y, Ji L, Zuo JM, Xia Y. Facile synthesis of tadpole-like nanostructures consisting of Au heads and Pd tails. Journal of the American Chemical Society 2007;129:15452.

[13] Brennecka GL, Payne DA, Sarin P, Zuo JM, Kriven WM, Hellwig H. Phase transformations in the high-temperature form of pure and TiO2-stabilized Ta2O5. Journal of the American Ceramic Society 2007;90:2947.

[14] Bohra F, Jiang B, Zuo JM. Textured crystallization of ultrathin hafnium oxide films on silicon substrate. Applied Physics Letters 2007;90:161917.

[15] Matthews KD, Lemaitre MG, Kim T, Chen H, Shim M, Zuo JM. Growth modes of carbon nanotubes on metal substrates. Journal of Applied Physics 2006;100:044309.

[16] Huang WJ, Chen H, Zuo JM. One-dimensional self-assembly of metallic nanostructures on single-walled carbon nanotube bundles. Small 2006;2 1418.

[17] Gao M, Zuo JM, Zhang R, Nagahara LA. Structure determinations of double-wall carbon nanotubes grown by catalytic chemical vapor deposition. Journal of Materials Science 2006;41:4382.

[18] Balakrishnan K, Datar A, Zhang W, Yang XM, Naddo T, Huang JL, Zuo JM, Yen M, Moore JS, Zang L. Nanofibril self-assembly of an arylene ethynylene macrocycle. Journal of the American Chemical Society 2006;128:6576.

[19] Agan S, Celik-Aktas A, Zuo JM, Dana A, Aydinli A. Synthesis and size differentiation of Ge nanocrystals in amorphous SiO2. Applied Physics a-Materials Science & Processing 2006;83:107.

[20] Zuo JM, Li BQ. Nanocluster interfaces and epitaxy: Ag on Si surfaces. Zeitschrift Fur Metallkunde 2005;96:438.

[21] Yang LC, Hsu CS, Chen GS, Fu CC, Zuo JM, Lee BQ. Strengthening TiN diffusion barriers for Cu metallization by lightly doping Al. Applied Physics Letters 2005;87.

[22] Tao J, Niebieskikwiat D, Salamon MB, Zuo JM. Lamellar phase separation and dynamic competition in La0.23Ca0.77MnO3. Physical Review Letters 2005;94.

[23] Lim CW, Shin CS, Gall D, Zuo JM, Petrov I, Greene JE. Growth of CoSi2 on Si(001) by reactive deposition epitaxy. Journal of Applied Physics 2005;97.

[24] Li BQ, Zuo JM. Structure and shape transformation from multiply twinned particles to epitaxial nanocrystals: Importance of interface on the structure of Ag nanoparticles. Physical Review B 2005;72:085434.

[25] Kim T, Zuo JM, Olson EA, Petrov I. Imaging suspended carbon nanotubes in field-effect transistors configured with microfabricated slits for transmission electron microscopy. Applied Physics Letters 2005;87:173108.

[26] Huang WJ, Li BQ, Zuo JM. Diffusion-limited submonolayer pentacene thin film growth on hydrogen-passivated Si(111) substrates. Surface Science 2005;595:157.

[27] Celik-Aktas A, Zuo JM, Stubbins JF, Tang CC, Bando Y. Double-helix structure in multiwall boron nitride nanotubes. Acta Crystallographica Section A 2005;61:533.

[28] Celik-Aktas A, Zuo JM, Stubbins JF, Tang C, Bando Y. Structure and chirality distribution of multiwalled boron nitride nanotubes. Applied Physics Letters 2005;86.

[29] Balakrishnan K, Datar A, Oitker R, Chen H, Zuo JM, Zang L. Nanobelt self-assembly from an organic n-type semiconductor: Propoxyethyl-PTCDI. Journal of the American Chemical Society 2005;127:10496.

[30] Zuo JM, Gao M, Tao J, Li BQ, Twesten R, Petrov I. Coherent nano-area electron diffraction. Microscopy Research and Technique 2004;64:347.

[31] Zuo JM. Measurements of electron densities in solids: a real-space view of electronic structure and bonding in inorganic crystals. Reports on Progress in Physics 2004;67:2053.

[32] Tao J, Zuo JM. Nanoscale phase competition during charge ordering in intrinsically strained La0.33Ca0.67MnO3. Physical Review B 2004;69.

[33] Li BQ, Swiech W, Venables JA, Zuo JM. A LEEM study of bamboo-like growth of Ag crystals on Si(001) surfaces. Surface Science 2004;569:142.

[34] Kim M, Zuo JM, Park GS. High-resolution strain measurement in shallow trench isolation structures using dynamic electron diffraction. Applied Physics Letters 2004;84:2181.

[35] Jiang B, Friis J, Holmestad R, Zuo JM, O'Keeffe M, Spence JCH. Electron density and implication for bonding in Cu. Physical Review B 2004;69.

[36] Zuo JM, Vartanyants I, Gao M, Zhang R, Nagahara LA. Atomic resolution imaging of a carbon nanotube from diffraction intensities. Science 2003;300:1419.

[37] Wang ZL, Kong XY, Zuo JM. Induced growth of asymmetric nanocantilever arrays on polar surfaces. Physical Review Letters 2003;91.

[38] Pacaud J, Zuo JM, Hoier R, Matsumura S. Quantitative electron diffraction evidence for one-dimensional ordering in magnetite above the Verwey transition. Microscopy and Microanalysis 2003;9:475.

[39] Li BQ, Zuo JM. Self-assembly of epitaxial Ag nanoclusters on H-terminated Si(111) surfaces. Journal of Applied Physics 2003;94:743.

[40] Jiang B, Zuo JM, Jiang N, O'Keeffe M, Spence JCH. Charge density and chemical bonding in rutile, TiO2. Acta Crystallographica Section A 2003;59:341.

[41] Jiang B, Zuo JM, Friis J, Spence JCH. On the consistency of QCBED structure factor measurements for TiO2 (rutile). Microscopy and Microanalysis 2003;9:457.

[42] Gao M, Zuo JM, Twesten RD, Petrov I, Nagahara LA, Zhang R. Structure determination of individual single-wall carbon nanotubes by nanoarea electron diffraction. Applied Physics Letters 2003;82:2703.

[43] Chen B, Gao M, Zuo JM, Qu S, Liu B, Huang Y. Binding energy of parallel carbon nanotubes. Applied Physics Letters 2003;83:3570.

[44] Bording JK, Li BQ, Shi YF, Zuo JM. Size- and shape-dependent energetics of nanocrystal interfaces: Experiment and simulation. Physical Review Letters 2003;90.

[45] Zuo JM, Li BQ. Nanostructure evolution during cluster growth: Ag on H-terminated Si(111) surfaces. Physical Review Letters 2002;88.

[46] Zuo JM. Quantitative electron incoherent scattering and application to nanometre-sized charge ordering in La2/3Ca1/3MnO3. Journal of Electron Microscopy 2002;51:S67.

[47] Murakami Y, Shindo D, Kikuchi M, Zuo JM, Spence JCH. Resonance effect in ELNES from perovskite-type manganites BiMnO3 and LaMnO3. Journal of Electron Microscopy 2002;51:99.

[48] Li BQ, Zuo JM. The development of epitaxy of nanoclusters on lattice-mismatched substrates: Ag on H-Si(111) surfaces. Surface Science 2002;520:7.

[49] Li BQ, Kojima I, Zuo JM. Surface evolution of ultrahigh vacuum magnetron sputter deposited amorphous SiO2 thin films. Journal of Applied Physics 2002;91:4082.

[50] Jiang B, Zuo JM, Chen Q, Spence JCH. Orbital ordering in LaMnO3: estimates of structure factors and comparison of measurement methods. Acta Crystallographica Section A 2002;58:4.

[51] Zuo JM, Tao J. Nanometer-sized regions of charge ordering and charge melting in La2/3Ca1/3MnO3 revealed by electron microdiffraction. Physical Review B 2001;6305.

[52] Zhurova EA, Zuo JM, Tsirelson VG. Topological analysis of electrostatic potential in SrTiO3. Journal of Physics and Chemistry of Solids 2001;62:2143.

[53] Spence JCH, O'Keeffe M, Zuo JM. Have orbitals really been observed? Journal of Chemical Education 2001;78:877.

[54] Chen Q, Tao J, Zuo JM, Spence JCH. Microstructure of La1-xCaxMnO3 studied by transmission electron microscopy. Journal of Materials Research 2001;16:2959.

[55] Zuo JM, Weierstall U, Peng LM, Spence JCH. Surface structural sensitivity of convergent-beam RHEED: Si (001)2x1 models compared with dynamical simulations. Ultramicroscopy 2000;81:235.

[56] Zuo JM, Pacaud J, Hoier R, Spence JCH. Experimental measurement of electron diffuse scattering in magnetite using energy-filter and imaging plates. Micron 2000;31:527.

[57] Zuo JM, O'Keeffe M, Kim M, Spence JCH. On closed-shell interactions, polar covalences, d shell moles, and direct images of orbitals: The case of cuprite - Response to the essay by S. G. Wang and W. H. E. Schwarz. Angewandte Chemie-International Edition 2000;39:3791.

[58] Zuo JM. Electron detection characteristics of a slow-scan CCD camera, imaging plates and film, and electron image restoration. Microscopy Research and Technique 2000;49:245.

[59] Dudarev SL, Peng LM, Savrasov SY, Zuo JM. Correlation effects in the ground-state charge density of Mott insulating NiO: A comparison of ab initio calculations and high-energy electron diffraction measurements. Physical Review B 2000;61:2506.

[60] Zuo JM, Kim M, O'Keeffe M, Spence JCH. Direct observation of d-orbital holes and Cu-Cu bonding in Cu2O. Nature 1999;401:49.

[61] Zuo JM. Accurate structure refinement and measurement of crystal charge distribution using convergent beam electron diffraction. Microscopy Research and Technique 1999;46:220.

[62] Weierstall U, Zuo JM, Kjorsvik T, Spence JCH. Convergent-beam RHEED in a dedicated UHV diffraction camera and applications to Si reconstructed surfaces. Surface Science 1999;442:239.

[63] Spence JCH, Calef B, Zuo JM. Dynamic inversion by the method of generalized projections. Acta Crystallographica Section A 1999;55:112.

[64] Peng LM, Zuo JM. Anisotropic dispersion of the band structure and formation of ring patterns in CBED. Acta Crystallographica Section A 1999;55:1026.

[65] Huang XMH, Zuo JM, Spence JCH. Wavefront reconstruction for in-line holograms formed by pure amplitude objects. Applied Surface Science 1999;148:229.

[66] Gao HX, Peng LM, Zuo JM. Lattice dynamics and Debye-Waller factors of some compounds with the sodium chloride structure. Acta Crystallographica Section A 1999;55:1014.

[67] Avilov AS, Kuligin AK, Pietsch U, Spence JCH, Tsirelson VG, Zuo JM. Scanning system for high-energy electron diffractometry. Journal of Applied Crystallography 1999;32:1033.

[68] Zuo JM, Kim M, Holmestad R. A new approach to lattice parameter measurements using dynamic electron diffraction and pattern matching. Journal of Electron Microscopy 1998;47:121.

[69] Zuo JM. Quantitative convergent beam electron diffraction. Materials Transactions Jim 1998;39:938.

[70] Kim MY, Zuo JM, Spence JCH. Ab-initio LDA calculations of the mean Coulomb potential V-0 in slabs of crystalline Si, Ge and MgO. Physica Status Solidi a-Applied Research 1998;166:445.

[71] Zuo JM, Okeeffe M, Rez P, Spence JCH. Charge density of MgO: Implications of precise new measurements for theory. Physical Review Letters 1997;78:4777.

[72] Zuo JM, Blaha P, Schwarz K. The theoretical charge density of silicon: Experimental testing of exchange and correlation potentials. Journal of Physics-Condensed Matter 1997;9:7541.

[73] Spence JCH, Zuo JM. Does electron holography energy-filter? Ultramicroscopy 1997;69:185.

[74] Spence JCH, Zhang X, Weierstall U, Zuo JM, Munro E, Rouse J. Low energy point reflection electron microscopy. Surface Review and Letters 1997;4:577.

[75] Ren G, Zuo JM, Peng LM. Accurate measurements of crystal structure factors using a FEG electron microscope. Micron 1997;28:459.

[76] Morniroli JP, Cordier P, Van Cappellen E, Zuo JM, Spence J. Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects. Microscopy Microanalysis Microstructures 1997;8:187.

[77] Holmestad R, Morniroli JP, Zuo JM, Spence JCH, Avilov A. Quantitative CBED studies of SiC 4H. Electron Microscopy and Analysis 1997. 1997. p.137.

[78] Zuo JM, McCartney MR, Spence JCH. Performance of imaging plates for electron recording. Ultramicroscopy 1996;66:35.

[79] Zuo JM. Electron detection characteristics of slow-scan CCD camera. Ultramicroscopy 1996;66:21.

[80] Shindo D, Gomyo A, Zuo JM, Spence JCH. Short-range ordered structure of Ga0.47In0.53As studied by energy-filtered electron diffraction and HREM. Journal of Electron Microscopy 1996;45:99.

[81] Zuo JM, Weickenmeier AL. On the Beam Selection and Convergence in the Bloch-Wave Method. Ultramicroscopy 1995;57:375.

[82] Peng LM, Zuo JM. Direct Retrieval of Crystal-Structure Factors in Theed. Ultramicroscopy 1995;57:1.

[83] Holmestad R, Zuo JM, Spence JCH, Hoier R, Horita Z. Effect of Mn Doping on Charge-Density in Gamma-Tial by Quantitative Convergent-Beam Electron-Diffraction. Philosophical Magazine a-Physics of Condensed Matter Structure Defects and Mechanical Properties 1995;72:579.

[84] Zhu YM, Zuo JM, Moodenbaugh AR, Suenaga M. Grain-Boundary Constraint and Oxygen Deficiency in Yba2cu3o7-Delta - Application of the Coincidence Site Lattice Model to a Noncubic System. Philosophical Magazine a-Physics of Condensed Matter Structure Defects and Mechanical Properties 1994;70:969.

[85] Spence JCH, Zuo JM, Okeeffe M, Marthinsen K, Hoier R. On the Minimum Number of Beams Needed to Distinguish Enantiomorphs in X-Ray and Electron-Diffraction. Acta Crystallographica Section A 1994;50:647.

[86] Zuo JM, Spence JCH, Downs J, Mayer J. Measurement of Individual Structure-Factor Phases with 10th-Degree Accuracy - the 00.2 Reflection in Beo Studied by Electron and X-Ray-Diffraction. Acta Crystallographica Section A 1993;49:422.

[87] Zuo JM, Spence JCH. Coherent Electron Nanodiffraction from Perfect and Imperfect Crystals. Philosophical Magazine a-Physics of Condensed Matter Structure Defects and Mechanical Properties 1993;68:1055.

[88] Zuo JM. Automated Structure-Factor Refinement from Convergent-Beam Electron-Diffraction Patterns. Acta Crystallographica Section A 1993;49:429.

[89] Zuo JM. New Method of Bravais Lattice Determination. Ultramicroscopy 1993;52:459.

[90] Tong JZ, Zuo JM, Eyring L. A Transmission Electron-Microscopy Diffraction and Simulation Method for Early-Stage Studies of the Evolution of Gel-Derived Zirconia Precursors. Journal of the American Ceramic Society 1993;76:857.

[91] Spence JCH, Cowley JM, Zuo JM. Electron Holographic Study of Ferroelectric Domain-Walls - Comment. Applied Physics Letters 1993;62:2446.

[92] Qian W, Spence JCH, Zuo JM. Transmission Low-Energy-Electron Diffraction (Tleed) and Its Application to the Low-Voltage Point-Projection Microscope. Acta Crystallographica Section A 1993;49:436.

[93] Holmestad R, Weickenmeier AL, Zuo JM, Spence JCH, Horita Z. Debye-Waller Factor Measurements in Tial from Holz Line-Intensities. Electron Microscopy and Analysis 1993. 1993. p.141.

[94] Gajdardziskajosifovska M, McCartney MR, Deruijter WJ, Smith DJ, Weiss JK, Zuo JM. Accurate Measurements of Mean Inner Potential of Crystal Wedges Using Digital Electron Holograms. Ultramicroscopy 1993;50:285.

[95] Zuo JM, Liu J. Resonance Effects in Rheed on Gaas(110) Surface. Surface Science 1992;271:253.

[96] Zuo JM. Automated Lattice-Parameter Measurement from Holz Lines and Their Use for the Measurement of Oxygen-Content in Yba2cu3o7-Delta from Nanometer-Sized Region. Ultramicroscopy 1992;41:211.

[97] Spence JCH, Zuo JM, Qian W. Atomic Resolution in Lensless Low-Energy Electron Holography - Comment. Physical Review Letters 1992;68:3256.

[98] Spence JCH, Zuo JM. Electron Microdiffraction. New York: Plenum, 1992.

[99] Zuo JM, Spence JCH. Automated Structure Factor Refinement from Convergent-Beam Patterns. Ultramicroscopy 1991;35:185.

[100] Zuo JM. Perturbation-Theory in High-Energy Transmission Electron-Diffraction. Acta Crystallographica Section A 1991;47:87.

[101] Zuo JM, Spence JCH, Petuskey W. Charge Ordering in Magnetite at Low-Temperatures. Physical Review B 1990;42:8451.

[102] Zuo JM, Spence JCH, Okeeffe M. Bonding Charge-Density in Gaas - Reply. Physical Review Letters 1989;62:2329.

[103] Zuo JM, Spence JCH, Hoier R. Accurate Structure-Factor Phase Determination by Electron-Diffraction in Noncentrosymmetric Crystals. Physical Review Letters 1989;62:547.

[104] Zuo JM, Hoier R, Spence JCH. 3-Beam and Many-Beam Theory in Electron-Diffraction and Its Use for Structure-Factor Phase Determination in Non-Centrosymmetric Crystal-Structures. Acta Crystallographica Section A 1989;45:839.

[105] Zuo JM, Gjonnes K, Spence JCH. Fortran Source Listing for Simulating 3-Dimensional Convergent Beam Patterns with Absorption by the Bloch Wave Method. Journal of Electron Microscopy Technique 1989;12:29.

[106] Spence JCH, Zuo JM, Lynch J. On the Holz Contribution to Stem Lattice Images Formed Using High-Angle Dark-Field Detectors. Ultramicroscopy 1989;31:233.

[107] Spence JCH, Zuo JM, Hoier R. Accurate Structure-Factor Phase Determination by Electron-Diffraction in Noncentrosymmetric Crystals - Reply. Physical Review Letters 1989;63:1119.

[108] Zuo JM, Spence JCH, O'keeffe M. Bonding in GaAs. Physical Review Letters 1988;61:353.

[109] Spence JCH, Zuo JM. Large Dynamic-Range, Parallel Detection System for Electron-Diffraction and Imaging. Review of Scientific Instruments 1988;59:2102.

[110] Ourmazd A, Spence JCH, Zuo JM, Li CH. Structural Characterization of Ba2ycu3o7 by High-Resolution Transmission Electron-Microscopy. Journal of Electron Microscopy Technique 1988;8:251.

[111] Hoier R, Zuo JM, Marthinsen K, Spence JCH. Determination of Structure Factor Phase Invariants from Non-Systematic Many-Beam Effects in Convergent-Beam Patterns. Ultramicroscopy 1988;26:25.

[112] Hoier R, Zuo JM, Marthinsen K, Spence JCH. Structure Factor Determination from 2-Dimensional Cbed Simulations in Noncentrosymmetric Crystals. Institute of Physics Conference Series 1988:25.